Data Analysis Software for Detecting Latent Defects on PASS Boards

• Perform statistical analysis using the latest AI technologies • Detect significant points that can cause latent defects • Provide feedback to improve quality in board production and design processes

FEB-LINE INSPECTION DATA CREATION SYSTEM UA1781

FLYING PROBE TEST 1/2 Data Generation Time With New Platform

• Easily generate test points even on the inner layer for cavity structures (one-point test-point generation) • Expanded touch panel functions for printed boards (Optional E7001) • Support for built-in component boards • High-precision relay-point deletion functionality that reliably delete only the unnecessary relay-points

FAIL VISUALIZER UA1782

Robust Support for Repair Work Using Simple Operations and Assistive Functionality

• Visualize test results from flying-probe testers • Pinpoint components and patterns from test result files • Display the probing positions of test fixtures or test heads for both ICT and bare board testers • Search for components and nets on device embedded substrates

FIT-LINE INSPECTION DATA CREATION SYSTEM UA1780

Data Creation Software for Populated Board Testing

• No need for camera-based teaching • No need to visually trace patterns under components • Easy generation of high-quality test data without boards • Support for the new FA1240 data format

EXTERNAL SHUNT HS-1 series

Expand Current Range for Use with the 50 mV full scale meter (50/60 Hz, 0.5 % class)

• Expand current range for the Meter Relay, or a switchboard meter • Combination use with the 50 mV meter * Please note that connections’ cores are not included. The total resistance of all shunt devices used should not exceed 0.1 Ω * If product includes an instrument number or is packaged with an instrument, use in combination with that instrument * Select a model such that input does not exceed 80 % of the rating. (0.5 accuracy definition requirements: 80 % or less of rated input, ambient temperature of 60 °C or less)

CURRENT TRANSFORMER CT-5MRN series

Expand Input Range for Use with Meter Relays (50/60 Hz, 1.0 % class)

METER RELAY 2104

Meter Relays in ±1.5% Class for Advancing Power Saving and Automation

• Ultra sensitive 1 µA, 10 mV DC movement • Includes a display lamp to illuminate movement at a glance • Relay action delays circuit closure upon power on • Both power circuitry and relay built-in *H-type: Lamp lights up and output relay contact operates at deflection of the needle to the right of the setting needle *L-type: Lamp lights up and output relay contact operates at deflection of the needle to the left of the setting needle *HL-type: Provides functionality of both H- and L-type models

METER RELAY 2103

Meter Relays in ±2.5% Class for Advancing Power Saving and Automation

CURRENT PROBE CT6710

Capture Inrush, Micro and High-Speed Currents with a Single Probe

• 3 ranges in a single probe – 30 A, 5 A, 0.5 A. Observe a wide current range from micro currents to 30 A. • Wide band: DC to 50 MHz (-3 dB) • High S/N ratio and 10 times output rate: Observe waveforms at 100 μA/div at oscilloscope maximum voltage sensitivity setting of 1 mV/div • Directly connect to an oscilloscope’s BNC input terminal *1 Also available: CT6711 Current Probe with DC to 120 MHz bandwidth

CURRENT PROBE CT6711

Capture Inrush, Micro and High-Speed Currents with a Single Probe

• 3 ranges in a single probe – 30 A, 5 A, 0.5 A. Observe a wide current range from micro currents to 30 A. • Wide band: DC to 120 MHz (-3 dB) • High S/N ratio and 10 times output rate: Observe waveforms at 100 μA/div at oscilloscope maximum voltage sensitivity setting of 1 mV/div • Directly connect to an oscilloscope’s BNC input terminal *1 Also available: CT6710 Current Probe with DC to 50 MHz bandwidth

CLAMP ON PROBE 3273-50

High S/N characteristics enable the measurement of 10 mA order current waveforms Wideband Current Probe for Oscilloscopes

• Waveform observation across a wide band from DC to 50 MHz • Connects directly to oscilloscope or Memory HiCorder BNC input terminal *1 • High S/N characteristics enable the measurement of 10 mA order current waveforms (3273-50, 3276)

CLAMP ON PROBE 3276

High S/N characteristics enable the measurement of 10 mA order current waveforms Wideband Current Probe for Oscilloscopes

• Waveform observation across a wide band from DC to MHz • Connects directly to oscilloscope or Memory HiCorder BNC input terminal *1 • High S/N characteristics enable the measurement of 10 mA order current waveforms

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